Lijst van analysemethoden voor materialen

Dit is een lijst van karakteriserings- en analysemethoden voor materialen en hun structuren. De technieken zijn essentieel in het vakgebied der materiaalkunde, maar worden ook veel toegepast in de vastestoffysica en analytische chemie. De analysemethoden worden weergegeven op basis van hun acroniem, indien aanwezig, en staan op alfabetische volgorde. Synoniemen zijn aangegeven en analysemethoden, die alleen als toevoeging op een andere methode mogelijk zijn, zijn aangegeven met "zie hoofdtechniek".

A

AAS – Atomaire-absorptiespectrometrie AED – Auger-elektrondiffractie AES – Auger-elektronspectroscopie AES – Atomaire emissie spectroscopie, synoniem met OES AFM – Atoomkrachtmicroscopie AFS of FCM – Fluorescentiespectroscopie APFIM – Atom probe field ion microscopie APS – Appearance potential spectroscopie ARPES – Angle resolved photoemission spectroscopie, synoniem met ARUPS ARUPS – Angle resolved ultraviolet photoemission spectroscopie ATR – Attenuatie van de totale reflectie AUC – Analytische ultracentrifugatie

B

BET – BET surface area measurement (BET van Brunauer, Emmett, Teller) BiFC – Bimolecular fluorescence complementation BKD – Backscatter Kikuchi diffraction, zie EBSD BRET – Förster resonance energy transfer BSED – Back scattered electron diffraction, synoniem van EBSD

C

CAICISS – Coaxial impact collision ion scattering spectroscopie CARS – Coherent anti-Stokes Ramanspectroscopie CBED – Convergent beam electron diffraction CCM – Charge collection microscopie, zie EM CDI – Coherent diffraction imaging CE – Capillaire elektroforese CET – Cryo-elektronentomografie, ET CL – Kathodeluminescentie CLSM – Confocal laser scanning microscopie COSY – Correlatie spectroscopie CR – Cyclotron resonance Cryo-EM – Cryo-elektronenmicroscopie, zie EM Cryo-SEM – Cryo-rasterelektronenmicroscopie, zie SEM CV – Cyclovoltammetrie

D

DDC – Dynamische differentiecalorimetrie DE(T)A – Diëlektrische thermische analyse dHvA – De Haas–van Alphen-analyse DIC – Differentiële interferentiecontrastmicroscopie Diëlektrische spectroscopie DLS – Dynamische lichtverstrooiing DLTS – Transiënte spectroscopie op diep niveau DMA, DMTA of DTMA – Dynamisch-mechanische analyse of dynamische thermo-mechanische analyse DPI – Interferometrie met dubbele polarisatie DRS – Diffuse reflectiespectroscopie DSC – Dynamische differentiecalorimetrie DTA – Differentiële thermische analyse DVS – Dynamische dampsorptie

E

EBIC – Electron beam induced current, zie IBIC EBS – Elastische (niet-Rutherford) backscattering spectrometrie, zie RBS EBSD – Electron backscatter diffraction ECOSY – Exclusive correlation spectroscopie ECT – Electrical capacitance tomography EDAX – Energy-dispersive analysis of x-rays EDMR – Electrically detected magnetic resonance, zie ESR of EPR EDS of EDX – Energy dispersive X-ray spectroscopie, zie SEM EELS – Elektronen energieverlies spectroscopie EFM – Electrostatic force microscopy EF-TEM – Energy filtered transmission electron microscopie, zie TEM EID – Electron induced desorption EIT en ERT – Elektrische impedantie-tomografie en elektrische weerstand tomografie EIS – Elektrochemische impedantie-spectroscopie EL – Elektroluminescentie Ellipsometrie Elektronenkristallografie ELS – Electrophoretic light scattering EM – Elektronenmicroscopie ENDOR – Electron nuclear double resonance, zie ESR EPMA – Elektronensonde-microanalyse of elektronenmicrosonde, zie SEM EPR – Elektron paramagnetische resonantie spectroscopie, zie ESR ERD of ERDA – Elastic recoil detection of elastic recoil detection analysis ESCA – Elektronenspectroscopie voor chemische analyse, zie XPS ESD – Electron stimulated desorption ESEM – Environmental scanning elektronenmicroscopie, zie SEM ESI-MS of ES-MS – Elektrospray-ionisatie massaspectrometrie of elektrospray massaspectrometrie ESR – Elektronspinresonantie-spectroscopie ESTM – Electrochemical scanning tunneling microscopie ET – Elektronentomografie EXAFS – Extended X-ray absorption fine structure EXSY – Exchange spectroscopie

F

FCS – Fluorescentie correlatie spectroscopie FCCS – Fluorescence cross-correlation spectroscopy FEM – Field emission microscopy FIB – Focused ion beam microscopy FIM-AP – Field ion microscopy–atom probe Flow birefringence Fluorescence anisotropy FLIM – Fluorescence lifetime imaging FCM – Fluorescentiemicroscopie FOSPM – Feature-oriented scanning probe microscopy, zie SPM FRET – Förster resonance energy transfer FRS – Forward Recoil Spectrometry, synoniem van ERD FTICR – Fourier-transform ion cyclotron resonance, zie CR FT-MS – Fourier-transform massaspectrometrie, zie MS FTIR – Fourier-transform infraroodspectroscopie, zie IR

G

GC – Gaschromatografie GC-MS – Gaschromatographie-massaspectrometrie, zie GC GDMS – Glow discharge mass spectrometry GDOS – Glow discharge optical spectroscopy GISAXS – Grazing incidence small angle X-ray scattering GIXD – Grazing incidence X-ray diffraction GIXR – Grazing incidence X-ray reflectivity GLC – Gas-vloeistofchromatografie, zie GC

H

HAADF – High angle annular dark-field imaging HAS – Helium atom scattering HPLC – High performance liquid chromatography HREELS of HEELS – High resolution electron energy loss spectroscopy, zie EELS HREM – High-resolution electron microscopy HRTEM – High-resolution transmission electron microscopy HI-ERDA – Heavy-ion elastic recoil detection analysis HE-PIXE – High-energy proton induced X-ray emission

l

IAES – Ion induced Auger electron spectroscopy, zie AES IBA – Ionenbundelanalyse IBIC – Ion beam induced charge microscopie ICP-AES – Inductively coupled plasma atomic emission spectroscopy ICP-MS – Inductief gekoppelde plasmamassaspectrometrie ICR – Ion cyclotron resonance IETS – Inelastic electron tunneling spectroscopy IGA – Intelligent gravimetric analysis IGF – Inert gas fusion IIX – Ion induced X-ray analysis, zie PIXE Immunofluorescentiemicroscopie, zie FCM INS – Ion neutralization spectroscopy Inelastic neutron scattering IRNDT – Infrared non-destructive testing of materials IRR – Infraroodreflectografie IRS – Infraroodspectroscopyie ISS – Ion scattering spectroscopy ITC – Isothermal titration calorimetry IVEM – Intermediate voltage electron microscopy, zie EM

L

LALLS – Low-angle laser light scattering LC – Vloeistofchromatografie LC-MS – Vloeistof chromatografie-massaspectrometrie, zie LC LEED – Laagenergetische elektrondiffractie LEEM – Lage-energie elektronenmicroscopie LEIS – Lage-energie ionenverstrooiing LFM – Lateral force microscopy LIBS – Laser induced breakdown spectroscopy LOES – Laser optical emission spectroscopy LS – Licht(Raman)verstrooiing of Ramanverstrooiing

M

MALDI – Matrix-assisted laser desorption/ionization MBE – Molecular beam epitaxy MEIS – Medium energy ion scattering MFM – Magnetic force microscopy MIT – Magnetic induction tomography MPM – Multiphoton fluorescence microscopy MRFM – Magnetic resonance force microscopy MRI – Magnetic resonance imaging MS – Massaspectrometrie MS/MS – Tandem mass spectrometry, zie MS MSGE – Mechanically stimulated gas emission Mössbauerspectroscopie MTA – Microthermische analyse

N

NAA – Neutronenactiveringsanalyse ND – Neutronendiffractie NDP – Neutron depth profiling NEXAFS – Near edge X-ray absorption fine structure, synoniem van XANES NIS – Nuclear inelastic scattering/absorption NMR – Kernspinresonantie-spectroscopie NOESY – Nuclear Overhauser effect spectroscopy NRA – Nuclear reaction analysis NSOM – Near-field optical microscopy

O

OBIC – Optical beam induced current ODNMR – Optically detected magnetic resonance, zie ESR OES – Optische emissie spectroscopie, synoniem met AES OM – Optische microscopie OM-TL – Optische microscopie met transmissie licht, zie OM OM-RL – Optische microscopie met gereflecteerd licht, zie OM Osmometry

P

PAS – Positron annihilation spectroscopy Fotoacoustic spectroscopie PAT of PACT – Fotoacoustische tomographie of photoacoustic computed tomography PAX – Fotoemissie van geadsorbeerde xenon PC of PCS – Photocurrent spectroscopy Fasecontrastmicroscopie PhD – Fotoelektronendiffractie PD – Photodesorption PDEIS – Potentiodynamic electrochemical impedance spectroscopy PDS – Photothermal deflection spectroscopy PED – Photoelectron diffraction PEELS – Parallel elektronen energieverlies spectroscopie, zie EELS PEEM – Fotoemissie elektronenmicroscopie of fotoelektron emissie microscopie PES – Fotoelektronenspectroscopie PINEM – photon-induced near-field electron microscopy PIGE – Particle (or proton) induced gamma-ray spectroscopy, zie nuclear reaction analysis PIXE – Particle (or proton) induced X-ray spectroscopy PL – Fotoluminescentie Porosimetrie Poederdiffractie PTMS – Photothermal microspectroscopy PTS – Photothermal spectroscopy

Q

QENS – Quasielastic neutron scattering QCM-D – Quartz crystal microbalance with dissipation monitoring

R

RS – Ramanspectroscopie RAXRS – Resonant anomalous X-ray scattering RBS – Rutherford backscattering spectrometrie REM – Reflectie-elektronenmicroscopie, zie EM RDS – Reflectance difference spectroscopy RHEED – Reflection high-energy electron diffraction RIMS – Resonance ionization mass spectrometry RIXS – Resonant inelastic X-ray scattering RR spectroscopy – Resonantie Ramanspectroscopie

S

SAD – Selected area diffraction SAED – Selected area electron diffraction SAM – Scanning Auger microscopy, zie AES SANS – Small-angle neutron scattering SAXS – Small-angle X-ray scattering SCANIIR – Surface composition by analysis of neutral species en ion-impact radiation SCEM – Scanning confocal electron microscopy SCM – Scanning capacitance microscopy SE – Spectroscopische ellipsometrie, zie ellipsometrie SEC – Size exclusionchromatografie SEIRA – Surface enhanced infrared absorption spectroscopy SEM – rasterelektronenmicroscopie, scanning electron microscopy SEI – Secondaire elektron imaging, zie SEM SERS – Surface enhanced Raman spectroscopy SERRS – Surface enhanced resonance Raman spectroscopy SESANS – Spin Echo Small Angle Neutron Scattering SEXAFS – Surface extended X-ray absorption fine structure SICM – Scanning ion-conductance microscopy SIL – Solid immersion lens SIM – Solid immersion mirror SIMS – Secondary ion mass spectrometry SNMS – Sputtered neutral species mass spectrometry SNOM – Scanning near-field optical microscopy SPECT – Single-photon emission computed tomography-scan SPM – Scanning probe microscopy SRM-CE/MS – Selected-reaction-monitoring capillaire elektroforese massaspectrometrie SSNMR – Solid-state nuclear magnetic resonance Starkeffect-spectroscopie STED – Stimulated emission depletion microscopy STEM – Scanning transmission electron microscopy, zie TEM STM – Scanning tunneling microscopy STS – Scanning tunneling spectroscopy SXRD – Surface X-ray diffraction, zie XRD

T

TAT of TACT – Thermoacoustisch tomografie of thermoacoustic computed tomography, zie PAT TEM – Transmissie-elektronenmicroscopie TGA – Thermogravimetric analysis TIKA – Transmitting ion kinetic analysis TIMS – Thermische ionisatie massaspectrometrie TIRFM – Totale interne reflectie fluorescentie microscopie TLS – Photothermal lens spectroscopy, a type of photothermal spectroscopy TMA – Thermo-mechanische analyse TOF-MS – Time-of-flight mass spectrometry TPEF of 2PEF – Two-photon excitation microscopy TXRF – Totale reflectie röntgenfluorescentie analyse, zie XRF

U

Ultrasound attenuation spectroscopy UPS – UV-fotoelektron spectroscopie USANS – Ultra small-angle neutron scattering USAXS – Ultra small-angle X-ray scattering UT – Ultrasoon onderzoek UV/Vis – Ultraviolet/visible-spectroscopie

V

VEDIC – Video-enhanced differential interference contrast microscopy Voltammetrie

W

WAXS – Wide angle X-ray scattering WDX of WDS – Wavelength dispersive X-ray spectroscopy